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HIGH TEMPERATURE SCANNING INDENTATION: LAST RESULTS ON AMORPHOUS SELENIUM sciencesconf.org:esmc2025:593196 |
Update of the HTSI method: application to mechanical characterization of CaF2 up to 800°C sciencesconf.org:esmc2025:592645 |
Recent developments to measure surface mechanical properties at high temperature and high strain rate sciencesconf.org:esmc2025:592868 |