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Browsing > By author > Gaillard Yves
In-situ imaging for the strain-engineering of deformable electrodes sciencesconf.org:esmc2025:593582 |
Influence of overload on the propagation of 3D short fatigue cracks sciencesconf.org:esmc2025:597409 |
Enhancing the information-richness of Berkovich nanoindentation testing to extract slip systems interaction parameters from residual topographies and crystal lattice rotations on FCC crystal using inverse method sciencesconf.org:esmc2025:597652 |
